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The structure, composition, chemical and electronic states of surfaces and interfaces are of interest for many applications such as catalysis, corrosion, adhesion, semiconductor and dielectric materials, and magnetic media. Surface characterization is used in a wide variety of industries including, automotive, aerospace, electronics, healthcare, and petrochemical. In this presentation, I will give an overview of a new ambient pressure X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) system that will be installed in Johnson Hall during Fall 2016. In addition to XPS and STM, I will highlight other experimental techniques that are integrated into this research instrument, and demonstrate their use on a range of applications.
Funding for this instrument was provided by the National Science Foundation, the M.J. Murdock Charitable Trust, Oregon BEST, ONAMI, the Colleges of Science and Engineering, Chemistry, Physics, CBEE, MIME, EECS, and the OSU Research Office.